5th International Conference on Spectroscopic Ellipsometry (ICSE-V)TOMPKINS, Harland G.Thin solid films. 2011, Vol 519, Num 9, issn 0040-6090, 444 p.Conference Proceedings

Application of ellipsometry techniques to biological materialsARWIN, Hans.Thin solid films. 2011, Vol 519, Num 9, pp 2589-2592, issn 0040-6090, 4 p.Conference Paper

Applications of ellipsometry in nanoscale science: Needs, status, achievements and future challengesLOSURDO, Maria.Thin solid films. 2011, Vol 519, Num 9, pp 2575-2583, issn 0040-6090, 9 p.Conference Paper

Infrared resonances of local fields and ellipsometric spectra of negative-refraction metamaterialsHUMLICEK, J.Thin solid films. 2011, Vol 519, Num 9, pp 2655-2658, issn 0040-6090, 4 p.Conference Paper

Random phase mask as a model of a rough surface Part II. ExperimentSVITASHEVA, S. N.Thin solid films. 2011, Vol 519, Num 9, pp 2722-2724, issn 0040-6090, 3 p.Conference Paper

Systematic combination of X-ray reflectometry and spectroscopic ellipsometry: A powerful technique for reliable in-fab metrologyNOLOT, E; ANDRE, A.Thin solid films. 2011, Vol 519, Num 9, pp 2782-2786, issn 0040-6090, 5 p.Conference Paper

Optimizing the ellipsometric analysis of a transparent layer on glassTOMPKINS, Harland G; SMITH, Steven; CONVEY, Diana et al.Surface and interface analysis. 2000, Vol 29, Num 12, pp 845-850, issn 0142-2421Article

Rotating compensator sampling for spectroscopic imaging ellipsometryMENG, Y. H; JIN, G.Thin solid films. 2011, Vol 519, Num 9, pp 2742-2745, issn 0040-6090, 4 p.Conference Paper

Plasmonics and effective-medium theoriesASPNES, D. E.Thin solid films. 2011, Vol 519, Num 9, pp 2571-2574, issn 0040-6090, 4 p.Conference Paper

Optical properties of ZnTe and ZnS nanocrystals by critical-points and Tauc―Lorentz modelsEN NACIRI, A; AHMED, F; STCHAKOVSKY, M et al.Thin solid films. 2011, Vol 519, Num 9, pp 2843-2846, issn 0040-6090, 4 p.Conference Paper

Validity of Lorentz―Lorenz equation in porosimetry studiesSCHWARZ, Daniel; WORMEESTER, Herbert; POELSEMA, Bene et al.Thin solid films. 2011, Vol 519, Num 9, pp 2994-2997, issn 0040-6090, 4 p.Conference Paper

Analysis of systematic errors in Mueller matrix ellipsometry as a function of the retardance of the dual rotating compensatorsBROCH, Laurent; EN NACIRI, Aotmane; JOHANN, Luc et al.Thin solid films. 2011, Vol 519, Num 9, pp 2601-2603, issn 0040-6090, 3 p.Conference Paper

Anisotropy-enhanced depolarization on transparent film/substrate systemFRANTA, Daniel; NECAS, David; OHLIDAL, Ivan et al.Thin solid films. 2011, Vol 519, Num 9, pp 2637-2640, issn 0040-6090, 4 p.Conference Paper

Annealing of polymer films with embedded silver nanoparticles: Effect on optical propertiesVOUE, M; DAHMOUCHENE, N; DE CONINCK, J et al.Thin solid films. 2011, Vol 519, Num 9, pp 2963-2967, issn 0040-6090, 5 p.Conference Paper

Dual rotating compensator ellipsometry: Theory and simulationsJIAN LI; RAMANUJAM, Balaji; COLLINS, R. W et al.Thin solid films. 2011, Vol 519, Num 9, pp 2725-2729, issn 0040-6090, 5 p.Conference Paper

Optical properties of gold island films―a spectroscopic ellipsometry studyLONCARIC, Martin; SANCHO-PARRAMON, Jordi; ZORC, Hrvoje et al.Thin solid films. 2011, Vol 519, Num 9, pp 2946-2950, issn 0040-6090, 5 p.Conference Paper

Optimized calibration and measurement procedures in rotating analyzer and rotating polarizer ellipsometryMÜNZ, F; HUMLICEK, J; MARSIK, P et al.Thin solid films. 2011, Vol 519, Num 9, pp 2703-2706, issn 0040-6090, 4 p.Conference Paper

Plasmon resonance shift during grazing incidence ion sputtering on Ag(001)WORMEESTER, Herbert; EVERTS, Frank; POELSEMA, Bene et al.Thin solid films. 2011, Vol 519, Num 9, pp 2664-2667, issn 0040-6090, 4 p.Conference Paper

Industrial applications of spectroscopic ellipsometryTOMPKINS, Harland G.Thin solid films. 2004, Vol 455-56, pp 772-778, issn 0040-6090, 7 p.Conference Paper

Optical conductivity of fci-ZnMgRE quasicrystalsTUMENAS, S; KARPUS, V; ARWIN, H et al.Thin solid films. 2011, Vol 519, Num 9, pp 2951-2954, issn 0040-6090, 4 p.Conference Paper

Phase-modulated ellipsometry for probing the temperature-induced phase transition in ruthenium-doped lead zinc niobate-lead titanate single crystalCHUANG, Chun-I; MARINOVA, Vera; LIN, Shiuan-Huei et al.Thin solid films. 2011, Vol 519, Num 9, pp 2867-2869, issn 0040-6090, 3 p.Conference Paper

Spectroscopic ellipsometry study of CuCdTeO thin films grown by reactive co-sputteringMENDOZA-GALVAN, A; JIMENEZ-SANDOVAL, S; CARMONA-RODRIGUEZ, J et al.Thin solid films. 2011, Vol 519, Num 9, pp 2899-2902, issn 0040-6090, 4 p.Conference Paper

Studies of optical anisotropy in opals by normal incidence ellipsometryREZA, A; BALEVICIUS, Z; VAISNORAS, R et al.Thin solid films. 2011, Vol 519, Num 9, pp 2641-2644, issn 0040-6090, 4 p.Conference Paper

Transmission Mueller matrix ellipsometry of chirality switching phenomenaARTEAGA, Oriol; EL-HACHEMI, Zoubir; CANILLAS, Adolf et al.Thin solid films. 2011, Vol 519, Num 9, pp 2617-2623, issn 0040-6090, 7 p.Conference Paper

Characterization of pulsed laser deposited hydrogenated amorphous silicon films by spectroscopic ellipsometryHANYECZ, István; BUDAI, Judit; SZILAGYI, Edit et al.Thin solid films. 2011, Vol 519, Num 9, pp 2855-2858, issn 0040-6090, 4 p.Conference Paper